ATE Test Engineer – Teradyne J750

**Job Title:** ATE Test Engineer – Teradyne J750
**Location:** Dallas, TX
**Work Type:** Fully Onsite

## Job Summary

We are seeking an experienced **ATE Test Engineer** to support Digital, PMIC, RF, and Mixed-Signal test programs using the **Teradyne J750 ATE platform**. The engineer will work closely with Design Engineering on first-silicon bring-up, device characterization, test-program development, debugging, and production release.

## Key Responsibilities

* Develop and debug test programs for **Digital, PMIC, RF, and Mixed-Signal** products using Teradyne J750 ATE and/or bench environments.
* Partner with Design Engineering on **first-silicon debug, device characterization, test-program bring-up, and production release**.
* Debug digital vectors including **JTAG, SCAN, ATPG, Functional, and MBIST**.
* Characterize devices across **PVT (Process, Voltage, Temperature)** conditions.
* Characterize RF, PMIC, and Mixed-Signal IP including **ADC, DAC, PLL**, and related circuitry.
* Support test-program handoff, production release, **yield improvement**, and **test-time reduction** initiatives.
* Collaborate with Product Engineering, Design Engineering, Quality Engineering, and Foundry Engineering teams.

## Required Qualifications

* Bachelor's degree or equivalent education in **Electronics / Electrical Engineering**.
* **Hands-on experience with Teradyne J750 ATE – REQUIRED.**
* Experience in **ATE Test Engineering** and test-program development/debugging.
* Experience with **bench instrumentation for IC characterization**.
* Strong knowledge of **analog and digital electronics**.
* Experience with semiconductor/device testing and characterization.
* Strong analytical and problem-solving skills with a hands-on laboratory mindset.
* Excellent verbal and written communication skills.
* Ability to work independently.
* Willingness to work **fully onsite in Dallas, TX**.

## Preferred Experience

* Digital test experience.
* **PMIC, RF, or Mixed-Signal** testing.
* JTAG / SCAN / ATPG / MBIST.
* First-silicon bring-up.
* PVT characterization.
* Production release, yield improvement, and test-time optimization.

## Key Skills

**Teradyne J750 | ATE Test Engineering | ATE Test Programs | IC Characterization | First Silicon Bring-Up | JTAG | SCAN | ATPG | MBIST | PVT | Digital Testing | PMIC | RF | Mixed Signal | Analog/Digital Electronics | Bench Instrumentation**

**Important:** Teradyne J750 hands-on experience is a **required qualification** for this position.